Please use this identifier to cite or link to this item: http://scholarbank.nus.edu.sg/handle/10635/81186
Title: Single Contact Optical Beam Induced Currents (SCOBIC) - a new failure analysis technique
Authors: Chin, J.M.
Phang, J.C.H. 
Chan, D.S.H. 
Soh, C.E.
Gilfeather, G.
Issue Date: 2000
Source: Chin, J.M.,Phang, J.C.H.,Chan, D.S.H.,Soh, C.E.,Gilfeather, G. (2000). Single Contact Optical Beam Induced Currents (SCOBIC) - a new failure analysis technique. Annual Proceedings - Reliability Physics (Symposium) : 420-424. ScholarBank@NUS Repository.
Abstract: The Single Contact Optical Beam Induced Currents (SCOBIC) is a new failure analysis technique. By connecting the substrate or power pins of an integrated circuit to the current amplifier, many junctions can be imaged. In contrast, in the optical beam induced current (OBIC) technique, only the junction directly connected to the current amplifier is imaged. The implementation of the SCOBIC approach is discussed and experimental results which validates the SCOBIC approach is presented. Application of the SCOBIC technique for CMOS devices is also discussed.
Source Title: Annual Proceedings - Reliability Physics (Symposium)
URI: http://scholarbank.nus.edu.sg/handle/10635/81186
ISSN: 00999512
Appears in Collections:Staff Publications

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