Please use this identifier to cite or link to this item: http://scholarbank.nus.edu.sg/handle/10635/80511
Title: Growth and investigation of quaternary III-III-III-V InGaAlAs alloy layers on InP by molecular beam epitaxy
Authors: Feng, Z.C. 
Chua, S.J. 
Raman, A. 
Williams, K.J.
Issue Date: Feb-1995
Citation: Feng, Z.C.,Chua, S.J.,Raman, A.,Williams, K.J. (1995-02). Growth and investigation of quaternary III-III-III-V InGaAlAs alloy layers on InP by molecular beam epitaxy. Journal of the Chinese Institute of Electrical Engineering, Transactions of the Chinese Institute of Engineers, Series E/Chung KuoTien Chi Kung Chieng Hsueh K'an 2 (1) : 69-73. ScholarBank@NUS Repository.
Abstract: A variety of III-V quaternary In1-x-yGaxAlyAs films, for use of 0.8-1.6 μm emission optoelectronic devices, have been grown on InP by molecular beam epitaxy (MBE). A comprehensive characterization was performed using double crystal X-ray diffraction (DCXRD), Raman scattering, Fourier transform infrared (FTIR) spectroscopy, photoluminescence (PL), on these heterostructures with different compositions and growth conditions. The lattice matched and mismatched structures are studied. Our analysis show that the interface mismatch exerts an important influence on the optical properties of these heterostructures, and conversely that Raman, PL and FTIR, which are powerful nondestructive tools, can be used to probe the interface mismatch.
Source Title: Journal of the Chinese Institute of Electrical Engineering, Transactions of the Chinese Institute of Engineers, Series E/Chung KuoTien Chi Kung Chieng Hsueh K'an
URI: http://scholarbank.nus.edu.sg/handle/10635/80511
ISSN: 10234462
Appears in Collections:Staff Publications

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