Please use this identifier to cite or link to this item: http://scholarbank.nus.edu.sg/handle/10635/77119
Title: Surface segregation of Sr in doped MgO: Comparison between x-ray photoelectron spectroscopy and atomistic ionic model simulations
Authors: Cao, L.L.
Egdell, R.G.
Flavell, W.R.
Mok, K.F. 
Mackrodt, W.C.
Keywords: Atomistic simulation
Ceramic oxide
Photoemission
Surface segregation
Issue Date: 1991
Source: Cao, L.L.,Egdell, R.G.,Flavell, W.R.,Mok, K.F.,Mackrodt, W.C. (1991). Surface segregation of Sr in doped MgO: Comparison between x-ray photoelectron spectroscopy and atomistic ionic model simulations. Journal of Materials Chemistry 1 (5) : 785-788. ScholarBank@NUS Repository.
Abstract: The surface coverage of Sr on doped MgO ceramics has been measured by angle-resolved X-ray photoelectron spectroscopy (XPS) for bulk doping levels in the range 3-1000 ppm. The experimental data are compared with results derived from atomistic simulations of the doped surface. At low doping levels Sr segregates by substitutional replacement of Mg in the top-most ionic layer of the ceramic and good agreement is found between the experimental Sr 3d:Mg 2s intensity ratio and values derived from atomistic simulation. However, at higher Sr doping levels there is evidence for build-up of Sr multilayers and formation of SrO as a discrete surface phase.
Source Title: Journal of Materials Chemistry
URI: http://scholarbank.nus.edu.sg/handle/10635/77119
ISSN: 09599428
Appears in Collections:Staff Publications

Show full item record
Files in This Item:
There are no files associated with this item.

Page view(s)

26
checked on Feb 17, 2018

Google ScholarTM

Check


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.