Study of natural and synthetic rubies by PIXE

Abstract

Trace element analysis of 160 natural- and synthetic rubies were carried out by using the technique of proton-induced x-ray emission (PIXE). It was found that the natural rubies contained more and higher concentrations of impurities than did their synthetic counterparts. Results suggest that vanadium and iron are good indicators for separating synthetic rubies from the natural ones. The concentration of chromium is also helpful in many cases for source identification.