Please use this identifier to cite or link to this item: https://doi.org/10.1117/12.323336
Title: Shear ESPI with small-objects
Authors: Sirohi, R.S.
Tay, C.J. 
Shang, H.M. 
Boo, W.P.
Issue Date: 1998
Citation: Sirohi, R.S., Tay, C.J., Shang, H.M., Boo, W.P. (1998). Shear ESPI with small-objects. Proceedings of SPIE - The International Society for Optical Engineering 3407 : 332-337. ScholarBank@NUS Repository. https://doi.org/10.1117/12.323336
Abstract: A method to obtain the thickness of the defect from the shear ESPI data was presented. Shear ESPI was applied for the nondestructive examination (NDT) of objects under magnification. A procedure used to identify the defective region and to estimate the thickness in the defective region was presented. The experiments were conducted on programmed defects with pressure loading and phase shift digital speckle shear interferometry (DSSI).
Source Title: Proceedings of SPIE - The International Society for Optical Engineering
URI: http://scholarbank.nus.edu.sg/handle/10635/75079
ISSN: 0277786X
DOI: 10.1117/12.323336
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