Please use this identifier to cite or link to this item: http://scholarbank.nus.edu.sg/handle/10635/74977
Title: Defect measurement using structured light system
Authors: Toh, Siew-Lok 
Low, W.K.
Tay, C.J. 
Shang, H.M. 
Asundi, Anand K. 
Issue Date: 1997
Source: Toh, Siew-Lok,Low, W.K.,Tay, C.J.,Shang, H.M.,Asundi, Anand K. (1997). Defect measurement using structured light system. Proceedings of SPIE - The International Society for Optical Engineering 2921 : 529-534. ScholarBank@NUS Repository.
Abstract: In this paper, a new digital speckle intensity correlation searching technique which is named as 'differential oriented search' is proposed. This method effectively makes use of the distribution characteristics of the correlation functions, which makes the calculating time be considerably reduced. Experimental results shows that, the method presented here is a kind of high speed, high accurate and practical correlation metrology.
Source Title: Proceedings of SPIE - The International Society for Optical Engineering
URI: http://scholarbank.nus.edu.sg/handle/10635/74977
ISBN: 0819423238
ISSN: 0277786X
Appears in Collections:Staff Publications

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