Please use this identifier to cite or link to this item: http://scholarbank.nus.edu.sg/handle/10635/73437
Title: Equivalent solder joint and equivalent layer models for the simulation of solder column failure under drop impact
Authors: Jie, G.
Lim, C.T. 
Tay, A.A.O. 
Issue Date: 2004
Source: Jie, G.,Lim, C.T.,Tay, A.A.O. (2004). Equivalent solder joint and equivalent layer models for the simulation of solder column failure under drop impact. Proceedings of 6th Electronics Packaging Technology Conference, EPTC 2004 : 547-552. ScholarBank@NUS Repository.
Abstract: In this paper, we provide two new equivalent global models - Equivalent Solder Joint model and Equivalent Layer model - to perform the simulation of solder joints under drop impact. A detailed global model with a fine mesh is used as a benchmark to control the accuracy of the simplified equivalent model. Excellent correlation has been achieved in these two models, when compared with the detailed global model. It is shown that by using these new models, the model size and computational processing time have been greatly reduced, while the accuracy of the results is still maintained. An electronic package with 10,000 interconnects undergoing drop impact was studied. We also apply the same approach for the simulation of packaging with underfill undergoing board level drop test. © 2004 IEEE.
Source Title: Proceedings of 6th Electronics Packaging Technology Conference, EPTC 2004
URI: http://scholarbank.nus.edu.sg/handle/10635/73437
ISBN: 0780388216
Appears in Collections:Staff Publications

Show full item record
Files in This Item:
There are no files associated with this item.

Page view(s)

17
checked on Dec 9, 2017

Google ScholarTM

Check


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.