Please use this identifier to cite or link to this item:
|Title:||Effects of ball pad configuration on joint reliability in BGA chip-scale packages|
|Source:||Chong, V.,Kheng, L.T.,Teck, L.C.,Gunawan, D.K. (2004). Effects of ball pad configuration on joint reliability in BGA chip-scale packages. Proceedings of 6th Electronics Packaging Technology Conference, EPTC 2004 : 735-739. ScholarBank@NUS Repository.|
|Abstract:||The drive for thinner, lighter, smaller semiconductor packages has produced not only a variety of advanced package configurations but numerous packaging concerns, including joint reliability, moisture-induced reliability, warpage, and coplanarity. One critical concern is the joint reliability of unique ball pad configurations in chip-scale packages (CSPs) rendered by the advancement of the micro-via technologies. This study examines the effects of ball pad configurations on solder joint integrity and reliability, with its focus on a conventional pad versus a via-defined pad configuration on bismaleimide triazine (BT) and flex interposers. The assessment of board-level reliability was correlated to solder ball shear tests and a simplified analytical model for further insights into the failure mechanism. © 2004 IEEE.|
|Source Title:||Proceedings of 6th Electronics Packaging Technology Conference, EPTC 2004|
|Appears in Collections:||Staff Publications|
Show full item record
Files in This Item:
There are no files associated with this item.
checked on Dec 9, 2017
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.