Please use this identifier to cite or link to this item: https://doi.org/10.4028/www.scientific.net/AMR.199-200.1984
Title: Curved layer fused deposition modeling in conductive polymer additive manufacturing
Authors: Diegel, O.
Singamneni, S.
Huang, B.
Gibson, I. 
Keywords: Additive manufacturing
Conductive 3D printing
Curved layer fused deposition modeling
Issue Date: 2011
Citation: Diegel, O., Singamneni, S., Huang, B., Gibson, I. (2011). Curved layer fused deposition modeling in conductive polymer additive manufacturing. Advanced Materials Research 199-200 : 1984-1987. ScholarBank@NUS Repository. https://doi.org/10.4028/www.scientific.net/AMR.199-200.1984
Abstract: This paper describes a curved-layer additive manufacturing technology that has the potential to print plastic components with integral conductive polymer electronic circuits. Researchers at AUT University in New Zealand and the National University of Singapore have developed a novel Fused Deposition Modeling (FDM) process in which the layers of material that make up the part are deposited as curved layers instead of the conventional flat layers. This technology opens up possibilities of building curved plastic parts that have conductive electronic tracks and components printed as an integral part of the plastic component, thereby eliminating printed circuit boards and wiring. It is not possible to do this with existing flat-layer additive manufacturing technologies as the continuity of a circuit could be interrupted between the layers. With curved-layer fused deposition modeling (CLFDM) this problem is removed as continuous filaments in 3 dimensions can be produced, allowing for continuous conductive circuits. © (2011) Trans Tech Publications.
Source Title: Advanced Materials Research
URI: http://scholarbank.nus.edu.sg/handle/10635/73296
ISBN: 9783037850374
ISSN: 10226680
DOI: 10.4028/www.scientific.net/AMR.199-200.1984
Appears in Collections:Staff Publications

Show full item record
Files in This Item:
There are no files associated with this item.

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.