Please use this identifier to cite or link to this item: https://doi.org/10.1063/1.1556273
Title: Microstructure and magnetic properties of CoZr thin film
Authors: Yao, X.-F.
Wang, J.-P. 
Zhou, T.-J.
Chong, T.C. 
Issue Date: 15-May-2003
Source: Yao, X.-F., Wang, J.-P., Zhou, T.-J., Chong, T.C. (2003-05-15). Microstructure and magnetic properties of CoZr thin film. Journal of Applied Physics 93 (10 3) : 8310-8312. ScholarBank@NUS Repository. https://doi.org/10.1063/1.1556273
Abstract: The microstructure and magnetic properties of CoZr thin films were analyzed. It was found that a change in magnetic phase occurs by annealing the as-deposited films at temperatures of above 550°C for 2 h. All the annealed films were observed to show perpendicular magnetic anisotropy.
Source Title: Journal of Applied Physics
URI: http://scholarbank.nus.edu.sg/handle/10635/70935
ISSN: 00218979
DOI: 10.1063/1.1556273
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