Please use this identifier to cite or link to this item:
|Title:||Effect of electric field on chemical bonds of carbon-doped silicon oxide as evidenced by in situ Fourier transform infrared spectroscopy|
|Citation:||Yiang, K.Y., Yoo, W.J., Krishnamoorthy, A. (2005). Effect of electric field on chemical bonds of carbon-doped silicon oxide as evidenced by in situ Fourier transform infrared spectroscopy. Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures 23 (2) : 433-436. ScholarBank@NUS Repository. https://doi.org/10.1116/1.1865114|
|Abstract:||In this study, we use in situ Fourier transform infrared (FTIR) spectroscopy on a carbon-doped silicon oxide (SiOCH) to determine the origins of its lower breakdown strength (compared to Si O2) and the precursors of dielectric breakdown. While subjecting the SiOCH film to externally applied electric fields, the FTIR spectra are recorded. Changes in peak area ratios and intensities are determined and correlated to field-induced perturbation of chemical bonds in SiOCH. This is a potentially powerful technique which provides new insights into the dielectric degradation and breakdown phenomena. © 2005 American Vacuum Society.|
|Source Title:||Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures|
|Appears in Collections:||Staff Publications|
Show full item record
Files in This Item:
There are no files associated with this item.
checked on Oct 15, 2018
WEB OF SCIENCETM
checked on Oct 8, 2018
checked on Sep 14, 2018
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.