Please use this identifier to cite or link to this item: http://scholarbank.nus.edu.sg/handle/10635/69392
Title: Analysis of IBIS model performance in simulation of simultaneous switching noise
Authors: Ji, Y.
Mouthaan, K. 
Venkatarayalu, N.V. 
Keywords: gate modulation effect
IBIS
overestimation
simultaneous switching noise
Issue Date: 2011
Source: Ji, Y.,Mouthaan, K.,Venkatarayalu, N.V. (2011). Analysis of IBIS model performance in simulation of simultaneous switching noise. Asia-Pacific Microwave Conference Proceedings, APMC : 1007-1010. ScholarBank@NUS Repository.
Abstract: Input/Output Buffer Information Specification (IBIS) models are widely used in signal integrity analysis of digital devices. Advantages of using IBIS models include protection of proprietary information and reduction of simulation time. However, compared with Spice models, IBIS models have some inherent deficiencies, which can lead to inaccurate results in simultaneous switching noise (SSN) simulations. This paper investigates in detail how the deficiencies in the IBIS models translate to inaccurate results in SSN simulations. Methods to improve SSN are briefly discussed and validated. The investigations will be useful to further improve the accuracy of IBIS models and to enhance their wider acceptance.© 2011 Engineers Australia.
Source Title: Asia-Pacific Microwave Conference Proceedings, APMC
URI: http://scholarbank.nus.edu.sg/handle/10635/69392
ISBN: 9780858259744
Appears in Collections:Staff Publications

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