Please use this identifier to cite or link to this item: https://doi.org/10.1166/nnl.2012.1367
Title: Advanced magnetic force microscopy for high resolution magnetic imaging
Authors: Ranjbar, M.
Piramanayagam, S.N.
Sbiaa, R.
Chong, T.C. 
Okamoto, I.
Keywords: Antiferromagnetic coupling
Magnetic force microscopy
Perpendicular magnetic anisotropy
Issue Date: Jun-2012
Source: Ranjbar, M., Piramanayagam, S.N., Sbiaa, R., Chong, T.C., Okamoto, I. (2012-06). Advanced magnetic force microscopy for high resolution magnetic imaging. Nanoscience and Nanotechnology Letters 4 (6) : 628-633. ScholarBank@NUS Repository. https://doi.org/10.1166/nnl.2012.1367
Abstract: Magnetic force microscopy (MFM) is one of the primary imaging tools for studying magnetic nanostructures. The resolution of MFM has been considered as a main issue in characterizing magnetic nanostructures smaller than 30 nm; especially for high density recording media beyond 1 Tbit/in2. In this letter, we investigated three different kinds of MFM tips such as those with a perpendicular magnetic anisotropy (PMA) derived from a crystallographic texture, antiferromagnetic coupled perpendicular (AFC) tips and tips with no crystallographic textures, resulting in no PMA. Their resolution, as measured using a recording media with written information, was compared with that of commercial MFM tips. The tip in the PMA configuration was found to provide the best resolution among all of them. © 2012 American Scientific Publishers.
Source Title: Nanoscience and Nanotechnology Letters
URI: http://scholarbank.nus.edu.sg/handle/10635/69241
ISSN: 19414900
DOI: 10.1166/nnl.2012.1367
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