Please use this identifier to cite or link to this item: https://doi.org/10.1109/ICCCAS.2010.5581886
Title: A new well-conditioned surface integral equation formulation for finite microstrip structures
Authors: Zhao, W.-J. 
Li, L.-W. 
Xiao, K.
Issue Date: 2010
Source: Zhao, W.-J.,Li, L.-W.,Xiao, K. (2010). A new well-conditioned surface integral equation formulation for finite microstrip structures. 2010 International Conference on Communications, Circuits and Systems, ICCCAS 2010 - Proceedings : 667-670. ScholarBank@NUS Repository. https://doi.org/10.1109/ICCCAS.2010.5581886
Abstract: An efficient (well-conditioned) surface integral equation formulation is proposed for the scattering and radiation analysis of finite microstrip structures. The formulation on dielectric interface consists of weighted sums of the field integral equations corresponding to the external and internal dielectric regions with appropriate weighting coefficients. Discretization of the formulation by the moment method and the Galerkin's testing procedure can produce a matrix equation with good conditioning. Numerical results are presented to demonstrate the efficiency and accuracy of the proposed formulation. © 2010 IEEE.
Source Title: 2010 International Conference on Communications, Circuits and Systems, ICCCAS 2010 - Proceedings
URI: http://scholarbank.nus.edu.sg/handle/10635/68937
ISBN: 9781424482238
DOI: 10.1109/ICCCAS.2010.5581886
Appears in Collections:Staff Publications

Show full item record
Files in This Item:
There are no files associated with this item.

Page view(s)

17
checked on Dec 16, 2017

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.