Please use this identifier to cite or link to this item: https://doi.org/10.1364/OPEX.13.000164
Title: White-light interference microscopy: Effects of multiple reflections within a surface film
Authors: Roy, M.
Cooper, I.
Moore, P.
Sheppard, C.J.R. 
Hariharan, P.
Issue Date: Jan-2005
Citation: Roy, M., Cooper, I., Moore, P., Sheppard, C.J.R., Hariharan, P. (2005-01). White-light interference microscopy: Effects of multiple reflections within a surface film. Optics Express 13 (1) : 164-170. ScholarBank@NUS Repository. https://doi.org/10.1364/OPEX.13.000164
Abstract: The effects of the presence of a transparent thin film on a test surface in white-light interferometric surface profiling are investigated. An expression is obtained for the output intensity variations in a Michelson interferometer which includes the effect of multiple reflections within the thin film. The number of reflections that need to be considered to obtain good convergence to the correct solution is discussed. © 2005 Optical Society of America.
Source Title: Optics Express
URI: http://scholarbank.nus.edu.sg/handle/10635/67350
ISSN: 10944087
DOI: 10.1364/OPEX.13.000164
Appears in Collections:Staff Publications

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