Submicron three-dimensional trenched electrodes and capacitors for DRAMs and FRAMs: Fabrication and electrical testing

Abstract

We report conformal deposition of both RuO2 electrodes and PbZrx Ti1-x O3 (PZT) capacitors in submicron Si trenches through the same in situ liquid source mist processing. The step coverage for the RuO2 electrodes is 75% at 225°C. After electroding, we deposited Pb (Zr,Ti) O3 thin films and nanotubes using the same apparatus with remanent polarization of ∼15 μC/ cm2. The step coverage was 59% on the sidewall and 79% on the bottom wall. Electrical testing showed charge storage (capacitance/trench) was 13±2 pF, with a breakdown voltage of 11.3±0.2 V and dielectric constant ε=166±30. This shows that a single inexpensive processing can produce fully electroded dynamic random access memory trenched capacitors with high aspect ratios and commercial electrical performance. © 2008 American Institute of Physics.