Please use this identifier to cite or link to this item: http://scholarbank.nus.edu.sg/handle/10635/63344
Title: Statistical monitoring and control of a low defect process
Authors: Goh, T.N. 
Issue Date: Nov-1991
Source: Goh, T.N. (1991-11). Statistical monitoring and control of a low defect process. Quality and Reliability Engineering International 7 (6) : 479-483. ScholarBank@NUS Repository.
Abstract: Advanced technologies today are such that it is possible to keep the occurrence of defects in manufactured products at very low levels. The use of the conventional c-chart for statistical control of defects in such products would encounter serious practical difficulties because the low defect counts would render invalid the theoretical assumptions used in the construction of the chart. Based on reasoning with fundamental probability distributions, this paper offers a simple and reliable solution that is particularly suited to on-line inspection and testing operations such as those found in an automated manufacturing environment.
Source Title: Quality and Reliability Engineering International
URI: http://scholarbank.nus.edu.sg/handle/10635/63344
ISSN: 07488017
Appears in Collections:Staff Publications

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