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|Title:||Selecting the most reliable population under step-stress accelerated life test|
|Authors:||Tang, L.C. |
Least favorable configuration
|Source:||Tang, L.C.,Sun, Y. (1999). Selecting the most reliable population under step-stress accelerated life test. International Journal of Reliability, Quality and Safety Engineering 6 (4) : 347-359. ScholarBank@NUS Repository.|
|Abstract:||Wo present a method for selecting the most reliable population under step-stress accelerated life testing with typo II censoring. We construct a new statistic, the transitional order statistic (TOS), and derive an approximate expression for its distribution. Using the TOS, a selection rule is formulated from the test results. For planning purposes, we establish the relation between sample size and the probability of correct selection by defining a nonlinear indifference zone under the least favorable configuration. Finally, a simulation study is performed to illustrate the selection procedure and to validate the associated probability of correct selection. © World Scientific Publishing Company.|
|Source Title:||International Journal of Reliability, Quality and Safety Engineering|
|Appears in Collections:||Staff Publications|
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