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https://scholarbank.nus.edu.sg/handle/10635/62867
| Title: | The study of piezoelectric effect in wurtzite GaN/InGaN/AlGaN multilayer structures | Authors: | Liu, W. Teo, K.L. Li, M.F. Chua, S.J. Uchida, K. Tokunaga, H. Akutsu, N. Matsumoto, K. |
Keywords: | Contactless electroreflectance Franz-Keldysh oscillations GaN Photovoltaic spectroscopy Piezoelectric effect Residual strain |
Issue Date: | 15-Jun-1998 | Citation: | Liu, W.,Teo, K.L.,Li, M.F.,Chua, S.J.,Uchida, K.,Tokunaga, H.,Akutsu, N.,Matsumoto, K. (1998-06-15). The study of piezoelectric effect in wurtzite GaN/InGaN/AlGaN multilayer structures. Journal of Crystal Growth 189-190 : 648-651. ScholarBank@NUS Repository. | Abstract: | By using photovoltaic spectroscopy and contactless electroreflectance spectroscopy, large electric field was found to exist in wurztite GaN/InGaN/AlGaN multilayer structures. The electric field strengths in the GaN layer and the AlGaN layer were obtained from the analysis of the Franz-Keldysh oscillations in contactless electroreflectance spectra. These electric fields were attributed to be induced by the piezoelectric effect in wurztite nitride systems. © 1998 Elsevier Science B.V. All rights reserved. | Source Title: | Journal of Crystal Growth | URI: | http://scholarbank.nus.edu.sg/handle/10635/62867 | ISSN: | 00220248 |
| Appears in Collections: | Staff Publications |
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