Please use this identifier to cite or link to this item:
https://doi.org/10.1016/0038-1101(92)90168-C
Title: | Contact resistivity measurement using four circular contacts | Authors: | Chua, S.J. Lee, S.H. |
Issue Date: | 1992 | Citation: | Chua, S.J., Lee, S.H. (1992). Contact resistivity measurement using four circular contacts. Solid-State Electronics 35 (9) : 1331-1335. ScholarBank@NUS Repository. https://doi.org/10.1016/0038-1101(92)90168-C | Abstract: | In this paper, a simple technique for measuring contact resistivity of metallization is proposed. It makes use of four circular contacts, a structure which is simple to fabricate and requires only two measurement steps to obtain the contact resistivity. This technique is suitable for process monitoring of contact resistivity in large-scale production where simplicity in fabricating the test structure and in measurement is a necessity. | Source Title: | Solid-State Electronics | URI: | http://scholarbank.nus.edu.sg/handle/10635/61967 | ISSN: | 00381101 | DOI: | 10.1016/0038-1101(92)90168-C |
Appears in Collections: | Staff Publications |
Show full item record
Files in This Item:
There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.