Please use this identifier to cite or link to this item: http://scholarbank.nus.edu.sg/handle/10635/61805
Title: An energy dependent model for type I magnetic contrast in the scanning electron microscope
Authors: Chim, W.K. 
Chan, D.S.H. 
Phang, J.C.H. 
Low, T.S. 
Thirumalai, S.
Keywords: energy filtering
field-distance integral
Magnetic contrast
quality factor
scanning electron microscope
secondary electrons
type I magnetic contrast
work function
Issue Date: Jun-1993
Source: Chim, W.K.,Chan, D.S.H.,Phang, J.C.H.,Low, T.S.,Thirumalai, S. (1993-06). An energy dependent model for type I magnetic contrast in the scanning electron microscope. Scanning Microscopy 7 (2) : 533-542. ScholarBank@NUS Repository.
Abstract: The modelling of the magnetic contrast phenomenon in the scanning electron microscope (SEM) is important in understanding the physics of the contrast mechanism and the associated signal detection. In this paper, we report an improved analytical model for Type I magnetic contrast calculations using an approximate form of the Chung and Everhart secondary electron (SE) energy distribution. Previous studies have neglected this factor by assuming a mono- energetic model in order to simplify the calculations. This new model can be used to study different material specimens by appropriate choice of the work function and field-distance integral. The effect of energy filtering on the Type I magnetic contrast and quality factor can also be studied with the improved model by substituting the low and high energy limits of the filtered SE distribution into the closed-form analytical expressions obtained. Results of the above-mentioned effects and the effect of collector aperturing are reported in this paper using the new improved energy dependent model.
Source Title: Scanning Microscopy
URI: http://scholarbank.nus.edu.sg/handle/10635/61805
ISSN: 08917035
Appears in Collections:Staff Publications

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