Please use this identifier to cite or link to this item: http://scholarbank.nus.edu.sg/handle/10635/61717
Title: A steady state drain current technique for generation and recombination lifetime measurement in the SOI MOSFET
Authors: Cheng, Z.Y. 
Ling, C.H. 
Keywords: Carrier generation lifetime
Fullydepleted soi mosfet
Recombination lifetime
Steady state drain current technique
Issue Date: 2000
Source: Cheng, Z.Y.,Ling, C.H. (2000). A steady state drain current technique for generation and recombination lifetime measurement in the SOI MOSFET. IEEE Transactions on Electron Devices 47 (1) : 97102-. ScholarBank@NUS Repository.
Abstract: A new steady state drain current technique is developed for both the generation and recombination lifetime extraction in the fullydepleted (FD) SOI MOSFET. At all times during the measurement the device has one silicon surface maintained in strong accumulation and the other surface in strong inversion. The accumulation layer is modulated with a negative ramp voltage applied to the gate so that more holes are demanded by the accumulation layer (nchannel enhancement MOSFET). When the demand for the additional holes cannot be met by generation in the bulk of the silicon film electrons from the inversion region have to be expelled resulting in a decrease in the external drain current. The drain current saturates when the rate of demand for additional holes is balanced by the rate of hole generation. From the measured saturation drain current together with the given ramp rate the generation lifetime can be easily determined. A positive ramp voltage is used to extract recombination lifetime. As a nonpulse technique only steady state parameters are measured. The technique has the added advantage of simplicity in the interpretation of the results. ©2000 IEEE.
Source Title: IEEE Transactions on Electron Devices
URI: http://scholarbank.nus.edu.sg/handle/10635/61717
ISSN: 00189383
Appears in Collections:Staff Publications

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