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|Title:||Surface roughness measurement in the submicrometer range using laser scattering|
|Authors:||Wang, S.H. |
|Citation:||Wang, S.H., Quan, C., Tay, C.J., Shang, H.M. (2000-06). Surface roughness measurement in the submicrometer range using laser scattering. Optical Engineering 39 (6) : 1597-1601. ScholarBank@NUS Repository. https://doi.org/10.1117/1.602535|
|Abstract:||A technique for measuring surface roughness in the submicrometer range is developed. The principle of the method is based on laser scattering from a rough surface. A telecentric optical setup that uses a laser diode as a light source is used to record the light field scattered from the surface of a rough object. The light intensity distribution of the scattered band, which is correlated to the surface roughness, is recorded by a linear photodiode array and analyzed using a single-chip microcomputer. Several sets of test surfaces prepared by different machining processes are measured and a method for the evaluation of surface roughness is proposed.|
|Source Title:||Optical Engineering|
|Appears in Collections:||Staff Publications|
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