Subspace-based optimization method in electric impedance tomography

Abstract

This paper extends the application of the subspace-based optimization method, which was originally proposed to solve inverse scattering problems, to two dimensional electric impedance tomography (EIT) problems with inclusions embedded in a known homogeneous background. Although the EIT problem is both physically and mathematically different from the inverse scattering problem, the EIT problem can be cast into an optimization problem whose objective function is in the same format as that of the inverse scattering problem. Numerical simulations validate the fast convergence and robustness of the proposed inverse method. © 2009 VSP.