Please use this identifier to cite or link to this item: https://doi.org/10.1049/el:20071442
Title: Simplified RF noise de-embedding method for on-wafer CMOS FET
Authors: Xiong, Y.-Z.
Issaoun, A.
Nan, L.
Shi, J.
Mouthaan, K. 
Issue Date: 2007
Source: Xiong, Y.-Z., Issaoun, A., Nan, L., Shi, J., Mouthaan, K. (2007). Simplified RF noise de-embedding method for on-wafer CMOS FET. Electronics Letters 43 (18) : 1000-1001. ScholarBank@NUS Repository. https://doi.org/10.1049/el:20071442
Abstract: A simplified RF noise de-embedding method for an on-wafer CMOS device using only one dummy structure for simplicity and area reduction is presented. The method describes the use of a 'thru' test structure to subtract completely the parasitic effects of pads and in/out interconnections from the device under test. A comparison of the de-embedding results among the simplified method and existing de-embedding methods is given, which proves that the new method is effective, accurate and time efficient. © The Institution of Engineering and Technology 2007.
Source Title: Electronics Letters
URI: http://scholarbank.nus.edu.sg/handle/10635/57408
ISSN: 00135194
DOI: 10.1049/el:20071442
Appears in Collections:Staff Publications

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