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|Title:||Simplified RF noise de-embedding method for on-wafer CMOS FET|
|Citation:||Xiong, Y.-Z., Issaoun, A., Nan, L., Shi, J., Mouthaan, K. (2007). Simplified RF noise de-embedding method for on-wafer CMOS FET. Electronics Letters 43 (18) : 1000-1001. ScholarBank@NUS Repository. https://doi.org/10.1049/el:20071442|
|Abstract:||A simplified RF noise de-embedding method for an on-wafer CMOS device using only one dummy structure for simplicity and area reduction is presented. The method describes the use of a 'thru' test structure to subtract completely the parasitic effects of pads and in/out interconnections from the device under test. A comparison of the de-embedding results among the simplified method and existing de-embedding methods is given, which proves that the new method is effective, accurate and time efficient. © The Institution of Engineering and Technology 2007.|
|Source Title:||Electronics Letters|
|Appears in Collections:||Staff Publications|
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