Probing layer number and stacking order of few-layer graphene by Raman Spectroscopy

Please use this identifier to cite or link to this item: https://doi.org/10.1002/smll.200901173

Title:	Probing layer number and stacking order of few-layer graphene by Raman Spectroscopy
Authors:	Hao, Y. Wang, Y. Wang, L. Ni, Z. Wang, Z. Wang, R. Koo, C.K. Shen, Z. Thong, J.T.L.
Issue Date:	18-Jan-2010
Citation:	Hao, Y., Wang, Y., Wang, L., Ni, Z., Wang, Z., Wang, R., Koo, C.K., Shen, Z., Thong, J.T.L. (2010-01-18). Probing layer number and stacking order of few-layer graphene by Raman Spectroscopy. Small 6 (2) : 195-200. ScholarBank@NUS Repository. https://doi.org/10.1002/smll.200901173
Abstract:	Layer number and stacking order of few-layer graphene (FLG) are of particular interest since they directly determine the performance of graphenebased electronic devices. By analyzing Raman spectra and Raman images, quantitative indices are extracted to discriminate the thickness of ABstacked FLG from single- to five-layer graphene; a few key spectral characteristics are also identified for FLG with misoriented stacking electronic structure graphene, Raman spectroscopy, stacking. © 2010 Wlley-VCH Verlag GmbH & Co. KGaA.
Source Title:	Small
URI:	http://scholarbank.nus.edu.sg/handle/10635/57123
ISSN:	16136810
DOI:	10.1002/smll.200901173
Appears in Collections:	Staff Publications

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