Please use this identifier to cite or link to this item:
|Title:||Magnetic force microscopy using focused ion beam sharpened tip with deposited antiferro-ferromagnetic multiple layers|
|Citation:||Liu, Z., Dan, Y., Jinjun, Q., Wu, Y. (2002-05-15). Magnetic force microscopy using focused ion beam sharpened tip with deposited antiferro-ferromagnetic multiple layers. Journal of Applied Physics 91 (10 I) : 8843-8845. ScholarBank@NUS Repository. https://doi.org/10.1063/1.1456056|
|Abstract:||The resolution of magnetic force microscopy can be improved by sharpening the tip using a focused ion beam (FIB). However, when the tip is too sharp it is difficult to deposit continuous films on the tip, and the magnetization of a certain portion of the tip may become unstable due to the small thickness or particle size of the magnetic coating. This in turn may degrade the signal to noise ratio of the detection signal. In this work, a novel tip coated with antiferromagnet-ferromagnet exchanged coupled multiple layers was developed. It was found that the newly developed tip exhibits a much higher resolution than the conventional trimmed and nontrimmed tips. © 2002 American Institute of Physics.|
|Source Title:||Journal of Applied Physics|
|Appears in Collections:||Staff Publications|
Show full item record
Files in This Item:
There are no files associated with this item.
checked on Jul 22, 2018
WEB OF SCIENCETM
checked on Jul 4, 2018
checked on May 5, 2018
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.