Please use this identifier to cite or link to this item: https://doi.org/10.1063/1.1456056
Title: Magnetic force microscopy using focused ion beam sharpened tip with deposited antiferro-ferromagnetic multiple layers
Authors: Liu, Z.
Dan, Y.
Jinjun, Q.
Wu, Y. 
Issue Date: 15-May-2002
Source: Liu, Z.,Dan, Y.,Jinjun, Q.,Wu, Y. (2002-05-15). Magnetic force microscopy using focused ion beam sharpened tip with deposited antiferro-ferromagnetic multiple layers. Journal of Applied Physics 91 (10 I) : 8843-8845. ScholarBank@NUS Repository. https://doi.org/10.1063/1.1456056
Abstract: The resolution of magnetic force microscopy can be improved by sharpening the tip using a focused ion beam (FIB). However, when the tip is too sharp it is difficult to deposit continuous films on the tip, and the magnetization of a certain portion of the tip may become unstable due to the small thickness or particle size of the magnetic coating. This in turn may degrade the signal to noise ratio of the detection signal. In this work, a novel tip coated with antiferromagnet-ferromagnet exchanged coupled multiple layers was developed. It was found that the newly developed tip exhibits a much higher resolution than the conventional trimmed and nontrimmed tips. © 2002 American Institute of Physics.
Source Title: Journal of Applied Physics
URI: http://scholarbank.nus.edu.sg/handle/10635/56552
ISSN: 00218979
DOI: 10.1063/1.1456056
Appears in Collections:Staff Publications

Show full item record
Files in This Item:
There are no files associated with this item.

SCOPUSTM   
Citations

25
checked on Dec 5, 2017

WEB OF SCIENCETM
Citations

25
checked on Oct 31, 2017

Page view(s)

26
checked on Dec 9, 2017

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.