Please use this identifier to cite or link to this item: https://doi.org/10.1063/1.1765202
Title: High-resolution nanowire atomic force microscope probe grown by a field-emission induced process
Authors: Tay, A.B.H.
Thong, J.T.L. 
Issue Date: 21-Jun-2004
Source: Tay, A.B.H., Thong, J.T.L. (2004-06-21). High-resolution nanowire atomic force microscope probe grown by a field-emission induced process. Applied Physics Letters 84 (25) : 5207-5209. ScholarBank@NUS Repository. https://doi.org/10.1063/1.1765202
Abstract: A field-emission induced process to grow high resolution nanowire probes for atomic force microscope (AFM) tip was described. The single-step and highly reproducible growth method used a proximal anode and operated in a lower field emission current regime where nanowire forking during growth was avoided. Fine, vetically aligned nanowire probes were produced whose length could be controlled by the growth duration. Field emission from the AFM tip occurred when a sufficiently high electric field was applied to the sharp AFM tip, initiating the growth of a nanowire at the tip.
Source Title: Applied Physics Letters
URI: http://scholarbank.nus.edu.sg/handle/10635/56208
ISSN: 00036951
DOI: 10.1063/1.1765202
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