High-resolution nanowire atomic force microscope probe grown by a field-emission induced process

Abstract

A field-emission induced process to grow high resolution nanowire probes for atomic force microscope (AFM) tip was described. The single-step and highly reproducible growth method used a proximal anode and operated in a lower field emission current regime where nanowire forking during growth was avoided. Fine, vetically aligned nanowire probes were produced whose length could be controlled by the growth duration. Field emission from the AFM tip occurred when a sufficiently high electric field was applied to the sharp AFM tip, initiating the growth of a nanowire at the tip.