Please use this identifier to cite or link to this item: https://doi.org/10.1063/1.1515120
Title: High-resolution atomic force microscope nanotip grown by self-field emission
Authors: Oon, C.H.
Thong, J.T.L. 
Lei, Y. 
Chim, W.K. 
Issue Date: 14-Oct-2002
Source: Oon, C.H.,Thong, J.T.L.,Lei, Y.,Chim, W.K. (2002-10-14). High-resolution atomic force microscope nanotip grown by self-field emission. Applied Physics Letters 81 (16) : 3037-3039. ScholarBank@NUS Repository. https://doi.org/10.1063/1.1515120
Abstract: A technique to grow a single tungsten filament tip on a tapping mode atomic force microscope (AFM) tip by a process of self-field emission in the presence of tungsten carbonyl is demonstrated. Such filaments have a tip radius of 1-2 nm and are grown to lengths ranging from 400 nm to 3 μm and a shank diameter of about 60-90 nm. Images of germanium nanocrystals and porous alumina membranes show much higher resolution and definition than standard AFM tips. The tip shows no degradation even after 10 h of scanning, demonstrating its utility as a practical tip. The self-aligned nature of the growth makes it a very simple nanotip fabrication technique. © 2002 American Institute of Physics.
Source Title: Applied Physics Letters
URI: http://scholarbank.nus.edu.sg/handle/10635/56207
ISSN: 00036951
DOI: 10.1063/1.1515120
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