Please use this identifier to cite or link to this item: https://doi.org/10.1023/B:IJIM.0000047445.50044.13
Title: Experimental characterization of on-chip single and double-coupling spiral inductors
Authors: Kang, K.
Yeo, T.-S.
Shi, J.
Wu, B. 
Keywords: Coupling
Inductance
On-chip single spiral inductors
Q-factor
Transfer losses
Issue Date: Oct-2004
Source: Kang, K.,Yeo, T.-S.,Shi, J.,Wu, B. (2004-10). Experimental characterization of on-chip single and double-coupling spiral inductors. International Journal of Infrared and Millimeter Waves 25 (10) : 1535-1544. ScholarBank@NUS Repository. https://doi.org/10.1023/B:IJIM.0000047445.50044.13
Abstract: Experimental investigations on on-chip single and double-coupling square spiral inductors on silicon substrate are performed. For each pair of double-coupling inductors, they have the same edge distance, but with different turn numbers. Based on the measured S-parameters using de-embedding procedure, the inductance and Q-factor of the single square inductor are examined at first, and good agreement is obtained in the extracted inductance, compared to the predicted values using a closed-form series inductance equation. While for double-coupling spiral inductors, the smaller the product of two turn numbers, the weaker coupling will be, and in particular at low frequencies.
Source Title: International Journal of Infrared and Millimeter Waves
URI: http://scholarbank.nus.edu.sg/handle/10635/55958
ISSN: 01959271
DOI: 10.1023/B:IJIM.0000047445.50044.13
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