Experimental characterization of coupling effects between two on-chip neighboring square inductors

Abstract

Comprehensive experimental results on the coupling effects between two on-chip symmetric and asymmetric neighboring inductors on GaAs substrates are presented in this paper. These pairs of inductors are fabricated with the same track width, turn number, and spacing. Based on the S parameters measured using de-embedding technique, we show the effects of edge distance between these two neighboring inductors on the return and transfer losses, and self-resonance frequency. Certain ways to reduce the transfer loss are explored.