Please use this identifier to cite or link to this item: https://doi.org/10.1109/TEMC.2003.815597
Title: Experimental characterization of coupling effects between two on-chip neighboring square inductors
Authors: Yin, W.-Y. 
Pan, S.J.
Li, L.W. 
Gan, Y.B. 
Keywords: Coupling
Inductance
On-chip neighboring inductors
Q factor
Return and transfer losses
Issue Date: Aug-2003
Source: Yin, W.-Y., Pan, S.J., Li, L.W., Gan, Y.B. (2003-08). Experimental characterization of coupling effects between two on-chip neighboring square inductors. IEEE Transactions on Electromagnetic Compatibility 45 (3) : 557-561. ScholarBank@NUS Repository. https://doi.org/10.1109/TEMC.2003.815597
Abstract: Comprehensive experimental results on the coupling effects between two on-chip symmetric and asymmetric neighboring inductors on GaAs substrates are presented in this paper. These pairs of inductors are fabricated with the same track width, turn number, and spacing. Based on the S parameters measured using de-embedding technique, we show the effects of edge distance between these two neighboring inductors on the return and transfer losses, and self-resonance frequency. Certain ways to reduce the transfer loss are explored.
Source Title: IEEE Transactions on Electromagnetic Compatibility
URI: http://scholarbank.nus.edu.sg/handle/10635/55956
ISSN: 00189375
DOI: 10.1109/TEMC.2003.815597
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