Please use this identifier to cite or link to this item: https://doi.org/10.1016/0038-1101(94)90096-5
Title: A direct and accurate method for the extraction of diffusion length and surface recombination velocity from an EBIC line scan
Authors: Ong, V.K.S. 
Phang, J.C.H. 
Chan, D.S.H. 
Issue Date: 1994
Source: Ong, V.K.S., Phang, J.C.H., Chan, D.S.H. (1994). A direct and accurate method for the extraction of diffusion length and surface recombination velocity from an EBIC line scan. Solid-State Electronics 37 (1) : 1-7. ScholarBank@NUS Repository. https://doi.org/10.1016/0038-1101(94)90096-5
Abstract: A new method is proposed for the determination of bulk minority carrier diffusion length and surface recombination velocity. This method uses data from an EBIC line scan in which the current collecting p -n junction or Schottky barrier is parallel to the electron beam. A 3-D computer simulation was used to verify the accuracy of the method. It was found that this method is simpler to use and more accurate than existing methods.
Source Title: Solid-State Electronics
URI: http://scholarbank.nus.edu.sg/handle/10635/54071
ISSN: 00381101
DOI: 10.1016/0038-1101(94)90096-5
Appears in Collections:Staff Publications

Show full item record
Files in This Item:
There are no files associated with this item.

SCOPUSTM   
Citations

36
checked on Mar 27, 2018

WEB OF SCIENCETM
Citations

37
checked on Mar 27, 2018

Page view(s)

31
checked on Apr 21, 2018

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.