Please use this identifier to cite or link to this item:
|Title:||A direct and accurate method for the extraction of diffusion length and surface recombination velocity from an EBIC line scan|
|Authors:||Ong, V.K.S. |
|Citation:||Ong, V.K.S., Phang, J.C.H., Chan, D.S.H. (1994). A direct and accurate method for the extraction of diffusion length and surface recombination velocity from an EBIC line scan. Solid-State Electronics 37 (1) : 1-7. ScholarBank@NUS Repository. https://doi.org/10.1016/0038-1101(94)90096-5|
|Abstract:||A new method is proposed for the determination of bulk minority carrier diffusion length and surface recombination velocity. This method uses data from an EBIC line scan in which the current collecting p -n junction or Schottky barrier is parallel to the electron beam. A 3-D computer simulation was used to verify the accuracy of the method. It was found that this method is simpler to use and more accurate than existing methods.|
|Source Title:||Solid-State Electronics|
|Appears in Collections:||Staff Publications|
Show full item record
Files in This Item:
There are no files associated with this item.
checked on Jul 19, 2018
WEB OF SCIENCETM
checked on Jul 3, 2018
checked on Jul 20, 2018
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.