Please use this identifier to cite or link to this item: https://doi.org/10.1016/S0169-4332(01)00397-X
Title: In situ XPS studies of thermally deposited potassium on poly(p-phenylene vinylene) and its ring-substituted derivatives
Authors: Li, S.
Kang, E.T. 
Neoh, K.G. 
Ma, Z.H.
Tan, K.L. 
Huang, W. 
Keywords: Charge transfer
Interface
MEH-PPV
Oxygen diffusion
Potassium
PPV
XPS
Issue Date: 21-Sep-2001
Source: Li, S., Kang, E.T., Neoh, K.G., Ma, Z.H., Tan, K.L., Huang, W. (2001-09-21). In situ XPS studies of thermally deposited potassium on poly(p-phenylene vinylene) and its ring-substituted derivatives. Applied Surface Science 181 (3-4) : 201-210. ScholarBank@NUS Repository. https://doi.org/10.1016/S0169-4332(01)00397-X
Abstract: The interactions of thermally evaporated potassium atoms with poly(p-phenylene vinylene) (PPV) and its soluble derivative, poly(2-methoxy-5-(2′-ethyl-hexyloxy)-1,4-phenylene vinylene) (MEH-PPV) was studied in situ by angle-resolved X-ray photoelectron spectroscopy (XPS). The changes in the C 1s core-level line shape of the polymers, the evolution of the K 2p core-level spectra, and the changes in chemical compositions at the interface with progressive deposition of the metal atoms were carefully monitored. The interactions of the K atoms with the conjugated polymer surfaces were compared with those involving metals of other work functions. Diffusion of the K atoms into the polymers and distinct charge transfer interactions were observed at the interface. The migration of bulk adsorbed oxygen to the surfaces of both polymers during the K deposition process resulted in an increase in oxygen concentration at the K/polymer interfaces. The diffusion of the adsorbed oxygen from the bulk of the conjugated polymer film played a dominant role in the interfacial reactions. The interfacial layer contains mainly oxidized metal and metal-polymer charge transfer species. © 2001 Elsevier Science B.V. All rights reserved.
Source Title: Applied Surface Science
URI: http://scholarbank.nus.edu.sg/handle/10635/52661
ISSN: 01694332
DOI: 10.1016/S0169-4332(01)00397-X
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