Please use this identifier to cite or link to this item:
|Title:||Planning step-stress life-test with a target acceleration-factor|
|Authors:||Yeo, K.-P. |
|Citation:||Yeo, K.-P., Tang, L.-C. (1999). Planning step-stress life-test with a target acceleration-factor. IEEE Transactions on Reliability 48 (1) : 61-67. ScholarBank@NUS Repository. https://doi.org/10.1109/24.765928|
|Abstract:||A sequential approach is presented to plan a multiple-steps step-stress accelerated life test (SSALT) with type-I censoring so as to achieve a pre-specified acceleration factor. An initial optimal plan for a simple SSALT, where one not only has to determine the optimum hold-time under low stress but also the optimum low stress level, is obtained by solving a constrained non-linear program. A backward recursion scheme generates the subsequent optimal low-stress levels and hold-times for multiple-step SSALT. An illustration using a 3-step SSALT is presented. The relative efficiency of the 2-step and 3-step SSALT is investigated. A numerical example illustrates the method under 2-step and 3-step SSALT.|
|Source Title:||IEEE Transactions on Reliability|
|Appears in Collections:||Staff Publications|
Show full item record
Files in This Item:
There are no files associated with this item.
checked on Oct 24, 2018
WEB OF SCIENCETM
checked on Oct 8, 2018
checked on Oct 20, 2018
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.