Please use this identifier to cite or link to this item: https://doi.org/10.1109/24.765928
Title: Planning step-stress life-test with a target acceleration-factor
Authors: Yeo, K.-P. 
Tang, L.-C. 
Issue Date: 1999
Source: Yeo, K.-P.,Tang, L.-C. (1999). Planning step-stress life-test with a target acceleration-factor. IEEE Transactions on Reliability 48 (1) : 61-67. ScholarBank@NUS Repository. https://doi.org/10.1109/24.765928
Abstract: A sequential approach is presented to plan a multiple-steps step-stress accelerated life test (SSALT) with type-I censoring so as to achieve a pre-specified acceleration factor. An initial optimal plan for a simple SSALT, where one not only has to determine the optimum hold-time under low stress but also the optimum low stress level, is obtained by solving a constrained non-linear program. A backward recursion scheme generates the subsequent optimal low-stress levels and hold-times for multiple-step SSALT. An illustration using a 3-step SSALT is presented. The relative efficiency of the 2-step and 3-step SSALT is investigated. A numerical example illustrates the method under 2-step and 3-step SSALT.
Source Title: IEEE Transactions on Reliability
URI: http://scholarbank.nus.edu.sg/handle/10635/51864
ISSN: 00189529
DOI: 10.1109/24.765928
Appears in Collections:Staff Publications

Show full item record
Files in This Item:
There are no files associated with this item.

SCOPUSTM   
Citations

43
checked on Dec 12, 2017

WEB OF SCIENCETM
Citations

33
checked on Oct 22, 2017

Page view(s)

57
checked on Dec 8, 2017

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.