Please use this identifier to cite or link to this item: http://scholarbank.nus.edu.sg/handle/10635/35454
Title: APERTURELESS NEAR-FIELD SCANNING RAMAN MICROSCOPY USING REFLECTION SCATTERING GEOMETRY
Authors: SHEN, ZE XIANG 
SUN, WANXIN 
Issue Date: 6-Sep-2002
Source: SHEN, ZE XIANG,SUN, WANXIN (2002-09-06). APERTURELESS NEAR-FIELD SCANNING RAMAN MICROSCOPY USING REFLECTION SCATTERING GEOMETRY. ScholarBank@NUS Repository.
Abstract: A laser beam (24) is focused to a small spot size onto a sample (14). A silver coated metal probe (16) has its tip positioned within the beam, close to or contacting the sample (14). A reflected Raman signal (28) is detected. The metal probe (16) enhances the Raman signal, and provides high resolution. It may be cantilevered, and scanned across the surface of the sample (14), with its position monitored via optical means (20, 22).
URI: http://scholarbank.nus.edu.sg/handle/10635/35454
Appears in Collections:Staff Publications

Show full item record
Files in This Item:
File Description SizeFormatAccess SettingsVersion 
WO2002068919A1.PDF553.51 kBAdobe PDF

OPEN

PublishedView/Download

Page view(s)

108
checked on Dec 8, 2017

Download(s)

120
checked on Dec 8, 2017

Google ScholarTM

Check


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.