Please use this identifier to cite or link to this item: http://scholarbank.nus.edu.sg/handle/10635/34851
Title: APERTURELESS NEAR-FIELD SCANNING RAMAN MICROSCOPY USING REFLECTION SCATTERING GEOMETRY
Authors: SHEN, ZE XIANG 
SUN, WANXIN 
Issue Date: 17-Dec-2003
Source: SHEN, ZE XIANG,SUN, WANXIN (2003-12-17). APERTURELESS NEAR-FIELD SCANNING RAMAN MICROSCOPY USING REFLECTION SCATTERING GEOMETRY. ScholarBank@NUS Repository.
Abstract: A laser beam (24) is focused to a small spot size onto a sample (14). A metal probe or metal coated probe (16) has its tip positioned within the beam, close to or contacting the sample (14). A reflected Raman signal (28) is detected. The probe (16) enhances the Raman signal, and provides high resolution. The probe may be silver coated; the distance between its tip and the sample can be controlled by either the principle of the cantilever or tuning fork; and it may be scanned across the surface of the sample (14), with its position monitored via optical means (20, 22).
URI: http://scholarbank.nus.edu.sg/handle/10635/34851
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