Investigation On The Structure And Magnetic Properties Of Co2MnSi Heusler Alloy For Spintronic Application

Abstract

The effects of MgO and Cr buffer layers on the structures and magnetic properties of Co2MnSi (CMS) thin films have been studied systematically. The CMS thin films were deposited on MgO (001) single crystal substrates with and without MgO or Cr buffer layer at room temperature by magnetron sputtering deposition and annealed at various temperatures. 2-theta and Phi-XRD analysis were used to analyze the structural properties. Magnetization curves and chemical analysis were used to study the magnetic properties. It was found that both MgO and Cr buffer layers could help induce the (001) epitaxial growth of the CMS thin films with B2 or L21 structure, while A2 structure was formed in the films without buffer layer.