Please use this identifier to cite or link to this item: https://doi.org/10.1109/AIPR.2008.4906451
Title: Investigating useful and distinguishing features around the eyelash region
Authors: Li Y.-H.
Savvides M.
Chen T. 
Keywords: ASM
Ethnic classification
Eyelash analysis
Soft biometrics
Issue Date: 2008
Citation: Li Y.-H., Savvides M., Chen T. (2008). Investigating useful and distinguishing features around the eyelash region. Proceedings - Applied Imagery Pattern Recognition Workshop : 4906451. ScholarBank@NUS Repository. https://doi.org/10.1109/AIPR.2008.4906451
Abstract: Traditionally, iris recognition is always about analyzing and extracting features from iris texture. We proposed to investigate regions around eyelashes and extract useful information which helps us to perform ethnic classification. We propose an algorithm which is easy to implement and effective. First, we locate eyelash region by using ASM to model eyelid boundary. Second, we extract local patch around local landmarks. After image processing, we are able to separate eyelashes and extract features from the directions of eyelashes. Those features are descriptive and can be used to train classifiers. Experimental results show our method can successfully perform East-Asian/Caucasian classification up to 93% accuracy, which shows our proposed method is useful and promising.
Source Title: Proceedings - Applied Imagery Pattern Recognition Workshop
URI: http://scholarbank.nus.edu.sg/handle/10635/146224
ISBN: 9781424431250
ISSN: 15505219
DOI: 10.1109/AIPR.2008.4906451
Appears in Collections:Staff Publications

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