Please use this identifier to cite or link to this item: https://scholarbank.nus.edu.sg/handle/10635/141267
Title: FINITE-ERROR LOCALIZATION FOR POINT EMITTERS WITHIN THE DIFFRACTION LIMIT
Authors: TANG ZONG SHENG
Keywords: Interferometric imaging, Image detection systems, Resolution,Microscopy, Interference microscopy
Issue Date: 24-Jan-2018
Citation: TANG ZONG SHENG (2018-01-24). FINITE-ERROR LOCALIZATION FOR POINT EMITTERS WITHIN THE DIFFRACTION LIMIT. ScholarBank@NUS Repository.
Abstract: Identifying object based on their optical information is a common practice in biology and astronomy. However, the capability of distinguishing multi- ple light sources with a very small separation is bounded by the diffraction limit of the light. Although there are multiple methods which can overcome this limit, modifying the light sources is always required. Recently, the idea of localizing points emitters within the diffraction limit by extracting the phase information of the light has been proposed.
URI: http://scholarbank.nus.edu.sg/handle/10635/141267
Appears in Collections:Master's Theses (Open)

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