Please use this identifier to cite or link to this item: http://scholarbank.nus.edu.sg/handle/10635/138197
Title: NANOSCALE CHARACTERIZATION OF THE PIEZOELECTRIC AND FERROELECTIC PROPERTIES OF PZN-PT SINGLE CRYSTALS BY SCANNING PROBE MICROSCOPY TECHNIQUES
Authors: WANG HONGLI
Keywords: PZN-PT, SPM, domain structure, polarization switching, surface potential
Issue Date: 24-Aug-2017
Source: WANG HONGLI (2017-08-24). NANOSCALE CHARACTERIZATION OF THE PIEZOELECTRIC AND FERROELECTIC PROPERTIES OF PZN-PT SINGLE CRYSTALS BY SCANNING PROBE MICROSCOPY TECHNIQUES. ScholarBank@NUS Repository.
Abstract: Relaxor piezoelectric materials of Pb(Zn1/3Nb2/3)O3-x%PbTiO3 (PZN- x%PT) single crystals, due to their superior dielectric and electromechanical properties, are promising candidates for next generation high-performance transducers, sensors and actuators. Despite extensive studies of these materials, the understanding of the domain structure, polarization switching and screening behaviors remains unclear. Therefore, the primary objective of this study is to systematically characterize the nanoscale piezoelectric and ferroelectric properties of the PZN-x%PT single crystals. The characterizations are mainly based on various advanced Scanning Probe Microscopy (SPM) techniques.
URI: http://scholarbank.nus.edu.sg/handle/10635/138197
Appears in Collections:Ph.D Theses (Open)

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