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Title: | APPLICATION OF PRECISION MEASUREMENTS WITH TRAPPED ION AND DEVELOPMENT OF A PLANAR SURFACE ION TRAP SETUP | Authors: | SWARUP DAS | Keywords: | Ion trap,Precision measurement, Surface trap | Issue Date: | 23-Feb-2017 | Citation: | SWARUP DAS (2017-02-23). APPLICATION OF PRECISION MEASUREMENTS WITH TRAPPED ION AND DEVELOPMENT OF A PLANAR SURFACE ION TRAP SETUP. ScholarBank@NUS Repository. | Abstract: | The thesis presents lifetime measurement of SF6 measured with an unprecedented precision. The electron affinity thus extracted soundly establishes the structure of an SF6 molecular ion as C4v symmetric. Furthermore photo excitation of trapped SF6- ions indicates delayed emission due to electron detachment and dissociation. In addition, a technique using a simple experimental approach to measure the vector magnetic field with a single trapped Ba+ ion is presented . The results indicate that multiple coherent population trapping (CPT) obtained by Zeeman degeneracy can be a good resource for high resolution, high sensitivity magnetometry. The last section of the thesis presents development of a planar ion trap set up using industrial approaches. It provides some insight into the problems that are faced with these kind of traps as compared to the conventional three dimensional traps. | URI: | http://scholarbank.nus.edu.sg/handle/10635/135827 |
Appears in Collections: | Ph.D Theses (Open) |
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