Please use this identifier to cite or link to this item: http://scholarbank.nus.edu.sg/handle/10635/135827
Title: APPLICATION OF PRECISION MEASUREMENTS WITH TRAPPED ION AND DEVELOPMENT OF A PLANAR SURFACE ION TRAP SETUP
Authors: SWARUP DAS
Keywords: Ion trap,Precision measurement, Surface trap
Issue Date: 23-Feb-2017
Citation: SWARUP DAS (2017-02-23). APPLICATION OF PRECISION MEASUREMENTS WITH TRAPPED ION AND DEVELOPMENT OF A PLANAR SURFACE ION TRAP SETUP. ScholarBank@NUS Repository.
Abstract: The thesis presents lifetime measurement of SF6 measured with an unprecedented precision. The electron affinity thus extracted soundly establishes the structure of an SF6 molecular ion as C4v symmetric. Furthermore photo excitation of trapped SF6- ions indicates delayed emission due to electron detachment and dissociation. In addition, a technique using a simple experimental approach to measure the vector magnetic field with a single trapped Ba+ ion is presented . The results indicate that multiple coherent population trapping (CPT) obtained by Zeeman degeneracy can be a good resource for high resolution, high sensitivity magnetometry. The last section of the thesis presents development of a planar ion trap set up using industrial approaches. It provides some insight into the problems that are faced with these kind of traps as compared to the conventional three dimensional traps.
URI: http://scholarbank.nus.edu.sg/handle/10635/135827
Appears in Collections:Ph.D Theses (Open)

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