Please use this identifier to cite or link to this item: https://doi.org/10.1109/20.951016
Title: Moment reversal characterization of thin magnetic film by VSM or AGFM
Authors: Shan, Z.S.
Xu, Y.
Wang, J.P. 
Chong, T.C. 
Malhotra, S.S.
Staffort, D.C.
Zhu, C.X.
Keywords: Anisotropy
Moment-decay
Switching volume
Thermal stability factor
Issue Date: Jul-2001
Citation: Shan, Z.S., Xu, Y., Wang, J.P., Chong, T.C., Malhotra, S.S., Staffort, D.C., Zhu, C.X. (2001-07). Moment reversal characterization of thin magnetic film by VSM or AGFM. IEEE Transactions on Magnetics 37 (4 I) : 1944-1946. ScholarBank@NUS Repository. https://doi.org/10.1109/20.951016
Abstract: An approach has been developed to determine the thermal stability factor (K uV*/k BT), switching volume (V*), anisotropy (K u), and dynamic coercivity (H C) in one set of "moment-decay measurements." The experimental results for three sets of media films, the CoCrPt: C and CoCrPt: SiO 2 granular films and CoCrTaPt commercial hard disks, are reported. This approach offers faster measurements and reproducible data.
Source Title: IEEE Transactions on Magnetics
URI: http://scholarbank.nus.edu.sg/handle/10635/131605
ISSN: 00189464
DOI: 10.1109/20.951016
Appears in Collections:Staff Publications

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