Please use this identifier to cite or link to this item:
https://doi.org/10.1063/1.4914393
| Title: | Correlation of a generation-recombination center with a deep level trap in GaN | Authors: | Nguyen, Xuan Sang Lin, Ke Fitzgerald, Eugene A. Chua, Soojin |
Issue Date: | 2015 | Publisher: | American Institute of Physics Inc. | Citation: | Nguyen, Xuan Sang, Lin, Ke, Fitzgerald, Eugene A., Chua, Soojin (2015). Correlation of a generation-recombination center with a deep level trap in GaN. Applied Physics Letters 106 (10). ScholarBank@NUS Repository. https://doi.org/10.1063/1.4914393 | Source Title: | Applied Physics Letters | URI: | http://scholarbank.nus.edu.sg/handle/10635/127200 | ISSN: | 36951 | DOI: | 10.1063/1.4914393 |
| Appears in Collections: | Staff Publications |
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