Reliability sampling plans for the two-parameter exponential distribution under progressive censoring

Abstract

This paper presents reliability sampling plans for the two-parameter exponential distribution under progressive censoring. These sampling plans are quite useful to practitioners, because they provide savings in resources and in total test time. Furthermore, they offer the flexibility to remove functioning test specimens from further testing at various stages of the experimentation. In the construction of these sampling plans, the operating characteristic curve is derived using the exact distributional properties of maximum likelihood estimators. An example is given to illustrate the application of the proposed sampling plans. © 1998 Carfax Publishing Ltd.