Non-invasive observation of external and internal deposition during membrane filtration by X-ray microimaging (XMI)

Please use this identifier to cite or link to this item: https://doi.org/10.1016/j.memsci.2004.10.035

Title:	Non-invasive observation of external and internal deposition during membrane filtration by X-ray microimaging (XMI)
Authors:	Yeo, A. Yang, P. Fane, A.G. White, T. Moser, H.O.
Keywords:	Microfiltration fouling Non-invasive observation X-ray microimaging
Issue Date:	15-Mar-2005
Citation:	Yeo, A., Yang, P., Fane, A.G., White, T., Moser, H.O. (2005-03-15). Non-invasive observation of external and internal deposition during membrane filtration by X-ray microimaging (XMI). Journal of Membrane Science 250 (1-2) : 189-193. ScholarBank@NUS Repository. https://doi.org/10.1016/j.memsci.2004.10.035
Abstract:	This paper describes the application of phase contrast X-ray microimaging (XMI) for the non-invasive observation of membrane filtration processes. Using a single hollow fibre with lumen feed of an iron hydroxide suspension it is shown that the technique can observe the cake layer inside the fibre and fouling deposition within the pores. This technique has the potential to observe real-time fouling phenomena within a membrane at a higher level of resolution than other non-invasive methods. © 2004 Elsevier B.V. All rights reserved.
Source Title:	Journal of Membrane Science
URI:	http://scholarbank.nus.edu.sg/handle/10635/113031
ISSN:	03767388
DOI:	10.1016/j.memsci.2004.10.035
Appears in Collections:	Staff Publications

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