Investigation of the crystallographic texture and interface roughness on CoCrPt/Ti magnetic thin films

Please use this identifier to cite or link to this item: https://doi.org/10.1063/1.1540133

Title:	Investigation of the crystallographic texture and interface roughness on CoCrPt/Ti magnetic thin films
Authors:	Sun, C.J. Chow, G.M. Wang, J.P. Soo, E.W. Je, J.H.
Issue Date:	15-May-2003
Citation:	Sun, C.J., Chow, G.M., Wang, J.P., Soo, E.W., Je, J.H. (2003-05-15). Investigation of the crystallographic texture and interface roughness on CoCrPt/Ti magnetic thin films. Journal of Applied Physics 93 (10 3) : 8725-8727. ScholarBank@NUS Repository. https://doi.org/10.1063/1.1540133
Abstract:	The correlation of the structure of the magnetic layer and of the interface of the magnetic layer and underlayer with the sputtering pressure was studied. Its effects on the magnetic properties of sputtered films was reported. Improved magnetic properties resulted from the combined effects of the higher crystallinity and better texture of the CoCrPt (002) film, and the higher interface roughness.
Source Title:	Journal of Applied Physics
URI:	http://scholarbank.nus.edu.sg/handle/10635/107284
ISSN:	00218979
DOI:	10.1063/1.1540133
Appears in Collections:	Staff Publications

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