Please use this identifier to cite or link to this item: https://doi.org/10.1166/jnn.2001.035
Title: Structural Effects of Ti Underlayer on CoCrPt Magnetic Films
Authors: Sun, C.J. 
Chow, G.M. 
Soo, E.W.
Wang, J.P.
Hwu, Y.K.
Cho, T.S.
Je, J.H.
Lee, H.H.
Kim, J.W.
Noh, D.Y.
Keywords: Cocrpt films
Ti underlayer
X-ray scattering
XANES
Issue Date: 2001
Citation: Sun, C.J.,Chow, G.M.,Soo, E.W.,Wang, J.P.,Hwu, Y.K.,Cho, T.S.,Je, J.H.,Lee, H.H.,Kim, J.W.,Noh, D.Y. (2001). Structural Effects of Ti Underlayer on CoCrPt Magnetic Films. Journal of Nanoscience and Nanotechnology 1 (3) : 271-273. ScholarBank@NUS Repository. https://doi.org/10.1166/jnn.2001.035
Abstract: The effects of long-range and short-range orders of Ti underlayer thickness on the magnetic properties of sputtered Co 72Cr 21 Pt 7 films were investigated using synchrotron X-ray scattering and X-ray absorption near-edge structure spectroscopy. The results were consistent with that of magnetic measurements and X-ray photoelectron spectroscopy. For thin Ti underlayers (10 nm), the oxidation of Ti and significant mixing of other elements within this underlayer did not promote texture development, further resulting in poor texturing of magnetic films and undesirable magnetic properties. Increased crystallinity and texture of metallic Ti in thicker underlayers enhanced the magnetic peak alignment and its properties.
Source Title: Journal of Nanoscience and Nanotechnology
URI: http://scholarbank.nus.edu.sg/handle/10635/107204
ISSN: 15334880
DOI: 10.1166/jnn.2001.035
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