Please use this identifier to cite or link to this item:
|Title:||Phase change of sputtered LaNi5 thin films due to hydrogenation|
|Authors:||Huang, L. |
|Source:||Huang, L.,Gong, H.,Gao, W. (1999). Phase change of sputtered LaNi5 thin films due to hydrogenation. Thin Solid Films 339 (1-2) : 78-81. ScholarBank@NUS Repository.|
|Abstract:||Polycrystalline LaNi5 thin films were prepared by a co-sputtering method. Structural changes of the films after the hydrogen absorption-desorption cycles at different temperatures and after the heat treatment in a hydrogen atmosphere were investigated by X-ray diffraction (XRD) analysis. At room temperature, the sputtered films have much longer cyclic stability; however, the increase of temperature during hydriding-dehydriding process, and the hydrogen heat treatment at elevated temperatures speed up the disproportionation reaction or the segregation of the LaNi5 alloy thin film. A comparison of the results of the sputtered LaNi5 thin film with the previously reported data of the evaporated LaNi5 thin film shows a significant improvement of the film stability. © 1999 Elsevier Science S.A. All rights reserved.|
|Source Title:||Thin Solid Films|
|Appears in Collections:||Staff Publications|
Show full item record
Files in This Item:
There are no files associated with this item.
checked on Jan 20, 2018
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.