Please use this identifier to cite or link to this item: http://scholarbank.nus.edu.sg/handle/10635/107164
Title: Phase change of sputtered LaNi5 thin films due to hydrogenation
Authors: Huang, L. 
Gong, H. 
Gao, W.
Keywords: Phase transitions
Sputtering
Surface segregation
X-ray diffraction
Issue Date: 1999
Source: Huang, L.,Gong, H.,Gao, W. (1999). Phase change of sputtered LaNi5 thin films due to hydrogenation. Thin Solid Films 339 (1-2) : 78-81. ScholarBank@NUS Repository.
Abstract: Polycrystalline LaNi5 thin films were prepared by a co-sputtering method. Structural changes of the films after the hydrogen absorption-desorption cycles at different temperatures and after the heat treatment in a hydrogen atmosphere were investigated by X-ray diffraction (XRD) analysis. At room temperature, the sputtered films have much longer cyclic stability; however, the increase of temperature during hydriding-dehydriding process, and the hydrogen heat treatment at elevated temperatures speed up the disproportionation reaction or the segregation of the LaNi5 alloy thin film. A comparison of the results of the sputtered LaNi5 thin film with the previously reported data of the evaporated LaNi5 thin film shows a significant improvement of the film stability. © 1999 Elsevier Science S.A. All rights reserved.
Source Title: Thin Solid Films
URI: http://scholarbank.nus.edu.sg/handle/10635/107164
ISSN: 00406090
Appears in Collections:Staff Publications

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