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Ariando .

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Full Name
Ariando .
Variants
Ariando, A.
Ariando
 
Main Affiliation
 
Faculty
 
Email
phyarian@nus.edu.sg
 

Publications

Refined By:
Author:  Dhar, S.
Date Issued:  2012

Results 1-8 of 8 (Search time: 0.004 seconds).

Issue DateTitleAuthor(s)
128-Oct-2012Cationic-vacancy-induced room-temperature ferromagnetism in transparent, conducting anatase Ti 1-xTa xO 2 (x ∼0.05) thin filmsRusydi, A. ; Dhar, S. ; Roy Barman, A.; Ariando ; Qi, D.-C. ; Motapothula, M.; Yi, J.B. ; Santoso, I. ; Feng, Y.P. ; Yang, K.; Dai, Y.; Yakovlev, N.L.; Ding, J. ; Wee, A.T.S. ; Neuber, G.; Breese, M.B.H. ; Ruebhausen, M.; Hilgenkamp, H.; Venkatesan, T. 
211-Jun-2012Coherently coupled ZnO and VO 2 interface studied by photoluminescence and electrical transport across a phase transitionSrivastava, A.; Herng, T.S. ; Saha, S.; Nina, B. ; Annadi, A.; Naomi, N.; Liu, Z.Q.; Dhar, S. ; Ariando ; Ding, J. ; Venkatesan, T. 
327-Aug-2012Electronic correlation and strain effects at the interfaces between polar and nonpolar complex oxidesAnnadi, A.; Putra, A. ; Liu, Z.Q.; Wang, X.; Gopinadhan, K. ; Huang, Z.; Dhar, S. ; Venkatesan, T. ; Ariando 
42012Interplay between carrier and cationic defect concentration in ferromagnetism of anatase Ti1-xTaxO2 thin filmsRoy Barman, A.; Annadi, A.; Gopinadhan, K. ; Lú, W.M.; Ariando ; Dhar, S. ; Venkatesan, T. 
520-Jul-2012Metallic state in La-doped YBa 2Cu 3O y thin films with n-type charge carriersZeng, S.W.; Wang, X.; Lü, W.M.; Huang, Z.; Motapothula, M.; Liu, Z.Q.; Zhao, Y.L.; Annadi, A.; Dhar, S. ; Mao, H. ; Chen, W. ; Venkatesan, T. ; Ariando 
61-Oct-2012Reversible ferromagnetism in rutile TiO 2 single crystals induced by nickel impuritiesZhao, Y.L.; Motapothula, M.; Yakovlev, N.L.; Liu, Z.Q.; Dhar, S. ; Rusydi, A. ; Ariando ; Breese, M.B.H. ; Wang, Q. ; Venkatesan, T. 
7Dec-2012The influence of la substitution and oxygen reduction in ambipolar La-doped YBa2Cu3Oy thin filmsZeng, S.W.; Huang, Z.; Wang, X.; Lü, W.M.; Liu, Z.Q.; Zhang, B.M.; Dhar, S. ; Venkatesan, T. ; Ariando 
82012Variable range hopping in TiO2 insulating layers for oxide electronic devicesZhao, Y.L.; Lv, W.M.; Liu, Z.Q.; Zeng, S.W.; Motapothula, M.; Dhar, S. ; Ariando ; Wang, Q. ; Venkatesan, T.