Please use this identifier to cite or link to this item: https://doi.org/10.1016/j.apsusc.2005.09.053
Title: Spectroscopy and imaging of metal-organic interfaces using BEEM
Authors: Kunardi, L.
Troadec, C.
Chandrasekhar, N. 
Keywords: BEEM
Hole injection
Interface
Schottky barrier
Issue Date: 31-Mar-2006
Citation: Kunardi, L., Troadec, C., Chandrasekhar, N. (2006-03-31). Spectroscopy and imaging of metal-organic interfaces using BEEM. Applied Surface Science 252 (11) : 4020-4022. ScholarBank@NUS Repository. https://doi.org/10.1016/j.apsusc.2005.09.053
Abstract: Charge injection from metal electrodes to organics is a subject of intense scientific investigation for organic electronics. Ballistic electron emission microscopy (BEEM) enables spectroscopy and imaging of buried interfaces with nanometer resolution. Spatial non-uniformity of carrier injection is observed for both Ag-PPP (poly-paraphenylene) and Ag-MEHPPV (poly-2-methoxy-5-2-ethyl-hexyloxy-1,4-phenylenevinylene) interfaces. BEEM current images are found to correlate only marginally with the surface topography of the Ag film. © 2005 Elsevier B.V. All rights reserved.
Source Title: Applied Surface Science
URI: http://scholarbank.nus.edu.sg/handle/10635/98889
ISSN: 01694332
DOI: 10.1016/j.apsusc.2005.09.053
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