Please use this identifier to cite or link to this item:
Title: Spectroscopy and imaging of metal-organic interfaces using BEEM
Authors: Kunardi, L.
Troadec, C.
Chandrasekhar, N. 
Keywords: BEEM
Hole injection
Schottky barrier
Issue Date: 31-Mar-2006
Citation: Kunardi, L., Troadec, C., Chandrasekhar, N. (2006-03-31). Spectroscopy and imaging of metal-organic interfaces using BEEM. Applied Surface Science 252 (11) : 4020-4022. ScholarBank@NUS Repository.
Abstract: Charge injection from metal electrodes to organics is a subject of intense scientific investigation for organic electronics. Ballistic electron emission microscopy (BEEM) enables spectroscopy and imaging of buried interfaces with nanometer resolution. Spatial non-uniformity of carrier injection is observed for both Ag-PPP (poly-paraphenylene) and Ag-MEHPPV (poly-2-methoxy-5-2-ethyl-hexyloxy-1,4-phenylenevinylene) interfaces. BEEM current images are found to correlate only marginally with the surface topography of the Ag film. © 2005 Elsevier B.V. All rights reserved.
Source Title: Applied Surface Science
ISSN: 01694332
DOI: 10.1016/j.apsusc.2005.09.053
Appears in Collections:Staff Publications

Show full item record
Files in This Item:
There are no files associated with this item.

Page view(s)

checked on Nov 18, 2021

Google ScholarTM



Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.